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SAE AMS3593 Tubing, Plastic, Electrical Insulation, Irradiated Polyvinylidene Fluoride, Semi-Rigid, Heat-Shrinkable, Ma

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Product Code:SAE AMS3593
Title:Tubing, Plastic, Electrical Insulation, Irradiated Polyvinylidene Fluoride, Semi-Rigid, Heat-Shrinkable, Marker Sleeving Grade, Low Outgassing
Issuing Committee:Ae8-D Wire And Cable Committee
Scope:This specification covers an irradiated, thermally-stabilized, flame-resistant, modified-polyvinylidene-fluoride plastic in the form of extra-thin-wall tubing. Primarily for use as a semi-rigid, electrical insulation tubing and marker sleeves in short lengths whose diameter can be reduced to a predetermined size by heating to temperatures of 175 degrees C (347 degrees F) or higher.
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【英文标准名称】:Plastics-Determinationofthermalconductivityandthermaldiffusivity-Part4:Laserflashmethod(ISO22007-4:2008);GermanversionENISO22007-4:2012
【原文标准名称】:塑料.导热系数和热扩散系数的测定.第4部分:激光闪光法(ISO22007-4-2008).德文版本EN22007-4-2012
【标准号】:ENISO22007-4-2012
【标准状态】:现行
【国别】:
【发布日期】:2012-04
【实施或试行日期】:
【发布单位】:欧洲标准学会(EN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Conductivity;Definitions;Heatcapacity;Laserbeams;Laserengineering;Measurement;Measuringtechniques;Plastics;Properties;Temperature;Temperaturerise;Testing;Testingdevices;Thermalconductivity;Thermaldiffusivity;Thermalproperties;Thermalpropertiesofmaterials
【摘要】:
【中国标准分类号】:G31
【国际标准分类号】:83_080_01
【页数】:18P;A4
【正文语种】:英语


【英文标准名称】:Semiconductordevices-Metallizationstressvoidtest
【原文标准名称】:半导体器件.金属化应力空隙试验
【标准号】:IEC62418-2010
【标准状态】:现行
【国别】:国际
【发布日期】:2010-04
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:铝;涂层;铜;电气工程;电子设备及元件;金属涂层;金属表面;迁移;可靠度;耐力;半导体器件;应力;应力测试;试验温度;试验
【英文主题词】:Aluminium;Coatings;Copper;Electricalengineering;Electronicequipmentandcomponents;Metalcoating;Metallicsurfaces;Migration;Reliability;Resistance;Semiconductordevices;Stress;Stresstests;Testtemperatures;Testing
【摘要】:ThisInternationalStandarddescribesamethodofmetallizationstressvoidtestandassociatedcriteria.Itisapplicabletoaluminium(Al)orcopper(Cu)metallization.Thisstandardisapplicableforreliabilityinvestigationandqualificationofsemiconductorprocess.
【中国标准分类号】:L40
【国际标准分类号】:25_220_40;31_080_01
【页数】:38P.;A4
【正文语种】:英语